X-ray diffraction analysis
Product Details:

Bourevestnik – Russia

General purpose X-ray diffractometers is able to solve a wide range of powder diffraction tasks. Independent control of detector and sample rotation enables to use the instrument for some analysis of single crystals.
Methods of X-ray diffraction analysis implemented in diffractometers are as follows:

• Qualitative and quantitative analysis of phase (mineral) composition of crystalline materials including analysis at changing of environmental conditions (temperature, atmospheric pressure (vacuum), gas medium composition).
• Determination of single-crystal orientation.
  
• Analysis of texture and stress state of polycrystalline objects.
• Determination of various structural features of crystalline materials including atomic structure research.