Michelson Interferometer
Product Details:
CAn interferometer is a measuring device that helps in measuring rough surface profiles on a test object. The measurement is performed using radiation that is coherent over a short distance, a reference beam being periodically modulated in its path of light within propagation time. They are made to interfere with a measuring beam reflected off of the surface of the test object, and the interfered radiation being evaluated with respect to the maximum of the interference contrast. With a simple design, a high measuring accuracy is achieved in that the measuring device has a modulation-interferometer arrangement MI, in which the path of light is altered using acousto optical deflectors. A compensation device is provided for correcting the spatial decoherence and dispersion. In a downstream demodulation-interferometer arrangement, the measuring beam is interfered by the reference beam and fed to a photo detector.