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Electron Microscope
Product Details:
Scanning Electron Microscope :
- Resolution : 3.0nm (30KV, SE Image)
- Magnification : x15 ~ x300,000
- Image : Secondary Electron Image(SEI)
- Accelerating Voltage : 0.5KV ~ 30KV
- Electron gun : W (Tungsten), Pre-Align Cartridge Filament
- Lens system : 3 LEVEL Reducing System
- Objective Iris : 4 LEVELs Variable Aperture
- Image shift : +/-50um (WD : 10mm)
- Stage(5-axis) Manual (4-axis) : X (40mm), Y(40mm), R (360°)
- Tilt:-20°~90° Auto(1-axis): Z (5 ~ 60mm)
- Specimen Size(Max) : 130mm